This new software is a revolutionary step into a modern use of the C+K probe family and offers a variety of new, convenient features.
- For the first time Cutometer® and all other C+K probes can be operated in one software easily and conveniently.
- Software works with any MPA system and Cutometer® Dual MPA 580 as well as MDD devices and supports several devices at the same time.
- Perform free measurements anywhere, with any probe in any order or use the study manager to design your study and save as many clicks & as much time as possible.
- Tags: new, modern way of identifying measurements in the database.
- All information are transferred into the database, convenient possibility of filtering the data you want to export for statistical analysis with a special export assistant.
- Easy and self-explanatory check calibration function for the probes with report.
- Supports the new fascinating probe Tewameter® TM Hex.
- New, interesting additional aging-parameters for the Cutometer®.
- Graphic explanation of complex results.